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Probe

《 Introduction》：

【Vertical MEMS probe】

   Application: Probe cards for wafer testing, IC testing.


【Cantilever probe, Blade pin】

   Application: Panel display testing, Packaging Testing, PCB Testing…etc.



【General Spec】

   Material: Ni alloy

   Min. Line/Space: 10μm

   Optional surface treatment such as Cu, Au, Pd.

   Thickness: 10um~120um.

* Liga provides customized service based on customer requirements.