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Probe

《Product Introduce 》：

【Vertical MEMS probe】

Application: Probe cards for wafer testing, IC testing.

 

【Cantilever probe, Blade pin】

Application: Panel display test, Packaging Test, PCB Test…etc. 

 

 Material: Ni alloy

 Min. Line/Space: 10μm

 Surface treatment available


* Liga provides customized service based on customer requirements.